Associate Professor S. Gardelis-Guest Editor

of a special issue of Microelectronis Reliability (Elsevier)

Assoc. Prof. Spiros Gardelis is a guest editor  of Microelectronics Reliability, Volume 114, November 2020, which includes the peer-reviewed manuscripts of all contributions presented at the 31st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2020) organized by the University of Athens (Greece), from October 4 to October 8, 2020. 

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